Evil Twin Attacks: Vulnerabilities and Défense Mechanisms
  • Author(s): Sahil Husen Shaikh ; Pawar Prajwal Ashok ; Pawar Amar Bhau
  • Paper ID: 1708466
  • Page: 864-871
  • Published Date: 16-05-2025
  • Published In: Iconic Research And Engineering Journals
  • Publisher: IRE Journals
  • e-ISSN: 2456-8880
  • Volume/Issue: Volume 8 Issue 11 May-2025
Abstract

The evolution of wireless communication technologies has greatly enhanced connectivity and digital engagement across the globe. However, this growth also exposes users to a range of sophisticated cybersecurity threats. Among these, the "Evil Twin Attack" stands out as one of the most deceptive, where attackers create rogue access points that impersonate legitimate Wi-Fi networks to intercept and manipulate user data. With the introduction of more secure and efficient protocols like Wi-Fi 6 and WPA3, there is an assumption of improved defense mechanisms. Despite these advancements, attackers continue to find loopholes and adapt their strategies. This paper presents a comprehensive study of Evil Twin Attacks, highlighting their operational framework, evolution, and implications in the context of modern wireless networks. It also explores the use of low-cost, readily available microcontrollers such as the ESP8266 and NodeMCU in executing these attacks. Furthermore, this study evaluates the effectiveness of existing defense mechanisms and proposes a multi-layered security strategy to mitigate potential threats.

Keywords

NodeMCU, ESPTool, SSID Authentication Flaws, SSID Evil Twin Attack, Wi-Fi 6, WPA3, ESP8266, NodeMCU, Cybersecurity, Wireless Security, Rogue Access Point, IoT Security, Network Defense

Citations

IRE Journals:
Sahil Husen Shaikh , Pawar Prajwal Ashok , Pawar Amar Bhau "Evil Twin Attacks: Vulnerabilities and Défense Mechanisms" Iconic Research And Engineering Journals Volume 8 Issue 11 2025 Page 864-871

IEEE:
Sahil Husen Shaikh , Pawar Prajwal Ashok , Pawar Amar Bhau "Evil Twin Attacks: Vulnerabilities and Défense Mechanisms" Iconic Research And Engineering Journals, 8(11)